Test partition supported or not ?
Posted: Wed May 29, 2019 4:02 pm
Hello,
Reading the docs concerning the partitions for the ESP32 https://docs.espressif.com/projects/esp ... ables.html , I read the following
So this seems to be supported (for reference, I'm using esp-idf v3.1.2), is it just the documentation that hasn't been updated or am I missing something here ?
Reading the docs concerning the partitions for the ESP32 https://docs.espressif.com/projects/esp ... ables.html , I read the following
. So I decided to check if the config used to define the GPIO to trigger the booting from the test partition is used somewhere (BOOTLOADER_NUM_PIN_APP_TEST) and yes it is ! From bootloader_start.c :test (0x2) is a reserved subtype for factory test procedures. It is not currently supported by the esp-idf bootloader.
Code: Select all
#ifdef CONFIG_BOOTLOADER_APP_TEST
if (bootloader_common_check_long_hold_gpio(CONFIG_BOOTLOADER_NUM_PIN_APP_TEST, CONFIG_BOOTLOADER_HOLD_TIME_GPIO) == 1) {
ESP_LOGI(TAG, "Detect a boot condition of the test firmware");
if (bs->test.offset != 0) {
boot_index = TEST_APP_INDEX;
return boot_index;
} else {
ESP_LOGE(TAG, "Test firmware is not found in partition table");
return INVALID_INDEX;
}
}
#endif