Hello, when testing RF tx characteristics at different temperatures we see that the output power and EVM values drift out of spec. Ambient temperature changes and/or heavy RF activity will cause this. We test temperatures from -40C to +85C. If the device is reset RF calibration is done and character...

Hello, when testing the Bluetooth RF characteristics using the controller_hci_uart application and the device under test mode, the results vary between different test iterations and also test cases fail. To initiate device under test mode we run the following HCI command sequence: HCI_Reset HCI_Set_...

Hi All! Is the esptool load_ram option working? During rf verification in production I would like to run the rf verification fw from RAM instead of flash. This would also be my preferred way of running rf verification for devices returned from customers. However if I try to use the load_ram option I...

I want to use an Anritsu MT8860C to verify the the rf settings by measuring output power and EVM values for different rates. However, when testing using the Anritsu MT8860C the esp32 will not follow the supported rates information element (IE) set in the AP beacon. The supported rates IE is the way ...

Hello! How shall the power back off configuration parameters be used? For band edge compliance I need to lower the output power on the lowest and top channels but I can't measure any difference when I change the backoff settings. For testing backoff configurations I have used channel 13. I enable ba...

Ok thanks,
it also seems like the settings file generated by the flash tool is not accepted by applications built using the esp-idf so I will drop this issue.

Hello! How are the rf settings used by the fcc test application changed? It seems like the ESP32_FCC_WIFI_BT_20161129.bin application only works if loaded to address 0x1000 and no secondary bootloader being used. The older ESP32_FCC_WIFI_20161010.bin is starting when I try a configuration with a boo...